This review paper aims to provide a survey of modeling and simulation of single-event effects (SEEs) in digital electronics at device, circuit and system levels. It primarily focuses on the specific multi-scale, multi-physics, multi-domain nature of SEEs and on the main underlying physical mechanisms that lead to the occurrence of single events in digital devices and circuits. This review addresses the different ways to model and simulate both in space and time this complex sequence of mechanisms from the particle-material interaction up to the electrical response of a given electronics device, circuit, or system. It highlights the specific features of each methodology, and discusses simulation requirements, code or model inputs and expected outputs.
Authors
- Bibliographic Reference
- Jean-Luc Autran, D. Munteanu. Multi-scale, Multi-physics Modeling and Simulation of Single Event Effects in Digital Electronics: from Particles to Systems. IEEE Transactions on Nuclear Science, 2024, pp.1-1. ⟨10.1109/TNS.2023.3337288⟩. ⟨hal-04333942⟩
- DOI
- https://doi.org/10.1109/TNS.2023.3337288
- HAL Collection
- ['Université de Rennes 1', 'Université de Toulon', 'CNRS - Centre national de la recherche scientifique', 'Aix Marseille Université', "Observatoire des Sciences de l'Univers de Rennes", 'Institut de Physique de Rennes', 'IPR - Matériaux Nanosciences', 'IM2NP- UMR 7334', 'Université de Rennes 1 - UFR Sciences et Propriétés de la Matière', 'UFR SPM Sciences et Propriétés de la Matière', 'Publications labos UR1 dans HAL-Rennes 1', 'UR1 - publications SDLM', 'TEST Université de Rennes CSS', 'Université de Rennes', 'Pôle Rennes 1 - Matériaux']
- HAL Identifier
- 4333942
- Institution
- ['Aix Marseille Université', 'Université de Toulon', 'Université de Rennes']
- Laboratory
- ['Institut des Matériaux, de Microélectronique et des Nanosciences de Provence', 'Institut de Physique de Rennes']
- Published in
- France
