The spatial distribution of trace elements across the region of interest in 265 each sample is presented in Supplementary Figures 2-5 and summarised in Table 2. [...] 352 The region of quartz analysed is largely featureless (Figure 11) but demonstrates the spatial 353 resolution of the technique as it resolves nanometer-scale clusters of Al and K concentrated in 354 surface defects and Si voids. [...] The highest 372 effective spatial resolution of 65 nm was achieved in a 50 μm width analysis of the UST-Q 373 sample, though at this scale the technique was only sensitive to the more abundant elements Al, 374 K, Na, and Ca. [...] 524 525 Implications 526 This is the first study to apply TOF-SIMS to quartz and cryptocrystalline silica and adds 527 to the limited literature of the technique’s geological applications. [...] To our knowledge, the measurement of trace elements to 65 533 nm precision marks the highest resolution analysis of any study of silica, and among the highest 534 resolution TOF-SIMS applications to the Earth sciences.
- Pages
- 51
- Published in
- United States of America
